Comparison between nonlinear measurements in patterned and unpatterned thin films

Superconductor Science and Technology, Vol. 17. May 2004.

Authors: C. Collado, , J. M. O’Callaghan

CTTC copyright disclaimer

For the reports in this repository we specifically note that

By accepting I agree to acknowledge and respect the rights of the copyright owner of the document I am about to access.