Methods of characterization of broadband dielectric properties-challenges in device fabrication and measurement

Chapter in “Ferroelectric thin films at microwave frequencies”, edited by T. Jackson (Research Signpost, T.C. 37/661 (2), Fort Post Office, Trivandrum – 695023, Kerala, India.

Authors: J. C. Booth, , N. D. Orloff, I. Takeuchi

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