Three-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning

in Proceedings of IEEE International Conference on Industrial Cyber-Physical Systems (ICPS 2020), 9-12 June 2020, virtual event.

Authors: D. Gutierrez-Rojas, M. Ullah, I. T. Christou, G. Almeida, P. H. J. Nardelli, D. Carrillo, J. M. Sant’Ana, H. Alves, M. Dzaferagic, A. Chiumento,

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